Mapping sunflower yield as affected by Ridolfia segetum patches and elevation by applying Evolutionary Product Unit Neural Networks to remote sensed data

Published in Computers and Electronics in Agriculture, 2008

Recommended citation: Pedro Antonio Gutiérrez, F. López-Granados, J.M Peña-Barragán, M. Jurado-Expósito, M.T. Gómez-Casero, César Hervás-Martínez, "Mapping sunflower yield as affected by Ridolfia segetum patches and elevation by applying Evolutionary Product Unit Neural Networks to remote sensed data." Computers and Electronics in Agriculture, Vol. 60(2), 2008, pp.122--132. http://dx.doi.org/10.1016/j.compag.2007.07.011